Semiconductor Machinery Layered Process Audit (LPA)
The Semiconductor Machinery Layered Process Audit (LPA) is a supremely efficient planning tool that will help save time & prevent loss.
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The LPA form can maximize wafer fabrication efforts by streamlining principle procedures. In an industry that demands organizational confidence & meticulous attention to detail, this form will reduce error, saving hours of painstaking administrative proofing. Designed to be simplistic in use, yet powerful in execution, all levels of management will gain the ability to develop tracking & planning programs that deliver results.